Title :
Improving K-SVD denoising by post-processing its method-noise
Author :
Romano, Yaniv ; Elad, Michael
Author_Institution :
Dept. of Electr. Eng., Technion - Israel Inst. of Technol., Haifa, Israel
Abstract :
Various patch-based image denoising algorithms have been shown to be very effective. Nevertheless, in most cases the difference between the noisy image and its denoised version (called “method-noise”) still contains traces of the original image content. In this paper we propose a novel technique for improving the K-SVD denoising results. Our scheme starts by applying the K-SVD on the given noisy image. Then, for each patch, we recover the “stolen” image content information from the method-noise by performing iterations of de-noising using the same atoms that represent the first-stage de-noised patch. Experimental results demonstrate the efficiency of this technique.
Keywords :
image denoising; singular value decomposition; K-SVD denoising; first-stage denoised patch; method-noise post-processing; original image content; patch-based image denoising algorithms; stolen image content information; Dictionaries; Image denoising; Noise measurement; Noise reduction; PSNR; Image denoising; K-SVD; dictionary; method-noise; sparse representations;
Conference_Titel :
Image Processing (ICIP), 2013 20th IEEE International Conference on
Conference_Location :
Melbourne, VIC
DOI :
10.1109/ICIP.2013.6738090