Title :
EDIF: test generation and fault simulation
Author_Institution :
Eng. DataXpress Inc., San Jose, CA, USA
fDate :
Feb. 29 1988-March 3 1988
Abstract :
The availability of commercially developed signal simulation products has created a need for a standard set of tests or benchmarks against which these products can be evaluated and compared. To be of any value, these benchmarks must be in a form that will allow them to be easily installed on the many different systems available. The electronic design interchange format (EDIF) is analyzed to determine if it is a viable form in which to distribute digital simulation benchmarks and tests.<>
Keywords :
digital simulation; logic CAD; logic testing; EDIF; digital simulation benchmarks; electronic design interchange format; fault simulation; signal simulation products; test generation; Automatic test pattern generation; Benchmark testing; Consumer electronics; Digital simulation; Electronic equipment testing; Logic design; Logic testing; Standards development; Switches; Timing;
Conference_Titel :
Compcon Spring '88. Thirty-Third IEEE Computer Society International Conference, Digest of Papers
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-8186-0828-5
DOI :
10.1109/CMPCON.1988.4887
