• DocumentCode
    3271653
  • Title

    Geostatistical-Inspired Metamodeling and Optimization of Nano-CMOS Circuits

  • Author

    Okobiah, Oghenekarho ; Mohanty, Saraju P. ; Kougianos, Elias

  • Author_Institution
    NanoSystem Design Lab., Univ. of North Texas, Denton, TX, USA
  • fYear
    2012
  • fDate
    19-21 Aug. 2012
  • Firstpage
    326
  • Lastpage
    331
  • Abstract
    With the continuous progression of semiconductor technology, nanoscale effects have become a persistent issue in the design of analog/mixed-signal (AMS) circuits. The cost of exploration and optimization of the design space increases to infeasible levels with conventional design methodologies. Different modeling techniques to reduce the cost of design exploration, while ensuring the accuracy of such models, have been introduced and continue to be a research problem. In this paper, a geostatistical inspired metamodeling and optimization technique is presented for fast and accurate design optimization of nano-CMOS circuits. The proposed design methodology incorporates a simple Kriging based metamodel which efficiently and accurately predicts design performance. The metamodel (instead of the circuit netlist) is subjected to a Gravitational Search Algorithm for optimization. This design methodology is applicable to AMS circuits and is illustrated with the optimization of power consumption of a 45nm CMOS thermal sensor. The method improves the power performance of the thermal sensor by 36.9% while reducing the design optimization time by 90% even with 6 design parameters.
  • Keywords
    CMOS integrated circuits; circuit optimisation; integrated circuit design; integrated circuit modelling; nanoelectronics; nanosensors; search problems; statistical analysis; temperature sensors; AMS circuits; CMOS thermal sensor; Kriging based metamodel; analog-mixed-signal design; geostatistical-inspired metamodeling; gravitational search algorithm; nanoCMOS circuit design optimization technique; nanoscale effects; power consumption; semiconductor technology; size 45 nm; Accuracy; Algorithm design and analysis; Metamodeling; Optimization; Radiation detectors; Temperature sensors; AMS design flow; Geostatistics; Gravitational search algorithm; Kriging methods; Nano-CMOS;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI (ISVLSI), 2012 IEEE Computer Society Annual Symposium on
  • Conference_Location
    Amherst, MA
  • ISSN
    2159-3469
  • Print_ISBN
    978-1-4673-2234-8
  • Type

    conf

  • DOI
    10.1109/ISVLSI.2012.12
  • Filename
    6296494