Title :
2D automated visual inspection system for the remote quality control of SMD assembly
Author :
Gallegos-Hernández, Alejandro ; Ruiz-Sánchez, Francisco J. ; Villalobos-Cano, J. René
Author_Institution :
Departamento de Ingenieria Electrica, CINVESTAV-IPN, Mexico City, Mexico
Abstract :
In this paper, we present a general description of a new automated visual inspection system designed with a mechatronic approach, to address the problem of quality control in a SMT assembly process line. The system provides hardware and software facilities to be used as a test bench for new algorithms related to inspection and decision making, and it allows for remote access. We include a description of our first application to detect presence/absence or misplace of surface mounted devices using 2D analysis and 3D reconstruction. Also, we describe the remote access package developed with Jini™ technologies to integrate our system to the Jini™ Virtual Manufacturing Lab. This AVI system was created as a part of the Mexico-USA project in manufacturing research, MANET.
Keywords :
automatic optical inspection; mechatronics; quality control; surface mount technology; 2D automated visual inspection system; Jini Virtual Manufacturing Lab; MANET; Mexico-USA project; SMD assembly; SMT assembly process line; hardware; mechatronic approach; remote access; remote quality control; software; surface mounted devices; test bench; Assembly systems; Decision making; Hardware; Inspection; Mechatronics; Quality control; Software algorithms; Software testing; Surface-mount technology; System testing;
Conference_Titel :
IECON 02 [Industrial Electronics Society, IEEE 2002 28th Annual Conference of the]
Print_ISBN :
0-7803-7474-6
DOI :
10.1109/IECON.2002.1185317