Title :
Catch The True Worst-case In Tolerance And Sensitivity Analysis By Genetic Algorithms And Affine Mathematics
Author :
Egiziano, L. ; Femia, N. ; Spagnuolo, G. ; Vocca, G.
Author_Institution :
Universita di Salerno
Keywords :
Arithmetic; Circuit noise; Electronic equipment; Fluctuations; Genetic algorithms; Noise reduction; Problem-solving; Safety; Sensitivity analysis; Uncertainty;
Conference_Titel :
Optimization of Electrical and Electronic Equipments, 1998. OPTIM '98. Proceedings of the 6th International Conference on
Conference_Location :
Brasov, Romania
Print_ISBN :
973-98511-2-6
DOI :
10.1109/OPTIM.1998.707999
