Title :
Deterioration in shield characteristics by signal lines and power lines passing through shield material
Author :
Miyazaki, Chiharu ; Oka, Naoto ; Uchida, Takeshi ; Fukasawa, Toru ; Nitta, Shuichi
Author_Institution :
Inf. Technol. R&D Center, Mitsubishi Electr. Corp., Kanagawa, Japan
Abstract :
The authors are developing the technology for designing shields of electronic equipment. As a factor which deteriorates shield characteristics, we pay attention to signal lines and power lines passing through a shield material. In this paper, we describe the effects of these lines on shield characteristics
Keywords :
electromagnetic shielding; EM coupling measurement; electronic equipment; power lines; shield characteristics deterioration; shield material; signal lines; Antenna measurements; Electromagnetic coupling; Electromagnetic measurements; Electromagnetic modeling; Length measurement; Printed circuits; Research and development; Resins; Signal design; Transmitting antennas;
Conference_Titel :
Electromagnetic Compatibility, 1999 International Symposium on
Conference_Location :
Tokyo
Print_ISBN :
4-9980748-4-9
DOI :
10.1109/ELMAGC.1999.801379
