DocumentCode
3272098
Title
Deterioration in shield characteristics by signal lines and power lines passing through shield material
Author
Miyazaki, Chiharu ; Oka, Naoto ; Uchida, Takeshi ; Fukasawa, Toru ; Nitta, Shuichi
Author_Institution
Inf. Technol. R&D Center, Mitsubishi Electr. Corp., Kanagawa, Japan
fYear
1999
fDate
1999
Firstpage
520
Lastpage
523
Abstract
The authors are developing the technology for designing shields of electronic equipment. As a factor which deteriorates shield characteristics, we pay attention to signal lines and power lines passing through a shield material. In this paper, we describe the effects of these lines on shield characteristics
Keywords
electromagnetic shielding; EM coupling measurement; electronic equipment; power lines; shield characteristics deterioration; shield material; signal lines; Antenna measurements; Electromagnetic coupling; Electromagnetic measurements; Electromagnetic modeling; Length measurement; Printed circuits; Research and development; Resins; Signal design; Transmitting antennas;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 1999 International Symposium on
Conference_Location
Tokyo
Print_ISBN
4-9980748-4-9
Type
conf
DOI
10.1109/ELMAGC.1999.801379
Filename
801379
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