Analysis and measurement of nonlinear effects in power amplifiers caused by thermal power feedback

Author

Schurack, E. ; Rupp, W. ; Latzel, T. ; Gottwald, A.

Author_Institution

Inst. for Commun. Eng., Federal Armed Forces Univ. Munich, Neubiberg, Germany

Volume

2

fYear

1992

fDate

10-13 May 1992

Firstpage

758

Abstract

In order to calculate and measure the influence of the internal-power-dependent thermally effected feedback in power amplifiers with bipolar transistors, a calculation method and measurement techniques are proposed, and results are presented. The aim was to describe a transistor including thermal power feedback and the surrounding network in a theoretical model, i.e. to find a mathematical description. A further objective was to clarify which distortion results from the pure electrical transistor properties and which additional distortion is caused by thermal feedback

Keywords

bipolar transistor circuits; electric distortion; equivalent circuits; feedback; nonlinear network analysis; power amplifiers; bipolar transistors; electrical transistor properties; nonlinear distortion; nonlinear effects; power amplifiers; theoretical model; thermal power feedback; Bipolar transistors; Cause effect analysis; Fluctuations; Force feedback; Force measurement; Power amplifiers; Power dissipation; Power measurement; Thermal engineering; Thermal force;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 1992. ISCAS '92. Proceedings., 1992 IEEE International Symposium on

Conference_Location

San Diego, CA

Print_ISBN

0-7803-0593-0

Type

conf

DOI

10.1109/ISCAS.1992.230111

Filename

230111