Title :
Experimental investigation of noise immunity diagnosis for printed circuit boards by bulk current injection test
Author :
Sasabe, Kohji ; Yoshida, Kazuhisa ; Bullivant, Adam ; Fujiwara, Osamu
Author_Institution :
Corp. Quality R&D Centre, Matsushita Electr. Works Ltd., Osaka, Japan
Abstract :
A simple method for diagnosing noise immunity of printed circuit boards (PCBs) by the bulk current injection (BCI) test was proposed, which can contribute to the PCB trace designs for common-mode noise. A grading index, which is defined as the ratio of the stray capacitances with and without critical IC of malfunction, was introduced to distinguish PCBs susceptible to the common-mode noise. This proposed method was validated experimentally using four PCBs with the same circuit but different trace designs. It was observed that the noise immunity of PCBs had a good correlation with the values of these grading indices
Keywords :
electromagnetic compatibility; electromagnetic interference; printed circuit testing; printed circuits; PCB noise immunity diagnosis; PCB trace designs; bulk current injection test; common-mode noise; grading index; grading indices; printed circuit boards; stray capacitances; Capacitance; Circuit noise; Circuit synthesis; Circuit testing; Crosstalk; Electromagnetic compatibility; Immunity testing; Impedance; Integrated circuit noise; Printed circuits;
Conference_Titel :
Electromagnetic Compatibility, 1999 International Symposium on
Conference_Location :
Tokyo
Print_ISBN :
4-9980748-4-9
DOI :
10.1109/ELMAGC.1999.801388