Title :
Automatic characterization and modeling of power consumption in static RAMs
Author :
Chinosi, Mauro ; Zafalon, Roberto ; Guardiani, Carlo
Author_Institution :
STMicroelectron. CR&D, Milian, Italy
Abstract :
An automatic modeling technique is presented in this paper that allows one to build an accurate model of power consumption in embedded memory blocks. A software neural-network is used to create a regression tree by automatically splitting those variables that have a discontinuous effect on the power consumption. An application of the methodology to the modeling of a 0.35 /spl mu/m CMOS embedded SRAM is presented.
Keywords :
CMOS memory circuits; SPICE; SRAM chips; VLSI; circuit analysis computing; circuit simulation; integrated circuit modelling; neural nets; 0.35 micron; automatic characterization; automatic modeling technique; discontinuous effect; embedded memory blocks; power consumption; regression tree; software neural-network; static RAMs;
Conference_Titel :
Low Power Electronics and Design, 1998. Proceedings. 1998 International Symposium on
Conference_Location :
Monterey, CA, USA
Print_ISBN :
1-58113-059-7
