Title :
Statistical threshold for real time pattern matching using projection kernels
Author :
Li, N. ; Cham, W.K.
Author_Institution :
Dept. of Electron. Eng., Chinese Univ. of Hong Kong, Shatin, China
Abstract :
This paper is concerned with real time pattern matching using projection kernels. We derive an analytical threshold based on statistical properties of random noise and characteristics of the projection kernels. The proposed threshold decision scheme provides a mean to perform automatic pattern matching without human intervention. Based on the required successful rate, the analytical threshold can reliably reject mismatch and keep the target pattern irrespective of the assumption of noise model. Experimental results show that the proposed threshold follows the ground truth threshold tightly, and the false rejection rate is less than 1% even the image is very noisy.
Keywords :
image matching; random noise; statistical analysis; projection kernels; random noise; real time pattern matching; statistical threshold; Application software; Computer vision; Euclidean distance; Humans; Image processing; Kernel; Noise level; Pattern analysis; Pattern matching; Working environment noise;
Conference_Titel :
Intelligent Signal Processing and Communication Systems, 2005. ISPACS 2005. Proceedings of 2005 International Symposium on
Print_ISBN :
0-7803-9266-3
DOI :
10.1109/ISPACS.2005.1595345