DocumentCode
3272512
Title
Fringe pattern profilometry based on inverse function analysis
Author
Hu, Yingsong ; Xi, Jiangtao ; Li, Enbang ; Chicharo, Joe ; Yang, Zongkai
Author_Institution
ScHoo of Electr. Comput. & Telecommun. Eng., Wollongong Univ., NSW, Australia
fYear
2005
fDate
13-16 Dec. 2005
Firstpage
61
Lastpage
64
Abstract
In this paper, we proposed a new algorithm, referred to as inverse function analysis (IFA) method based on the derived mathematical model to reconstruct 3-D surfaces using fringe pattern profilometry (FPP) technique. Compared with traditional methods, our algorithm has neither the requirement for the structure of projected fringe patterns, nor the prior knowledge of the characteristics of projection systems. The correctness of inverse function analysis (IFA) method has been confirmed by simulation results. It can be seen that the measurement accuracy has been significantly improved by inverse function analysis (IFA) method, especially when the expected sinusoidal fringe patterns are distorted by unknown nonlinear factors.
Keywords
image reconstruction; 3D surface reconstruction; fringe pattern profilometry; inverse function analysis; Charge coupled devices; Charge-coupled image sensors; Distortion measurement; Gratings; Image analysis; Image reconstruction; Information analysis; Mathematical model; Pattern analysis; Surface reconstruction;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent Signal Processing and Communication Systems, 2005. ISPACS 2005. Proceedings of 2005 International Symposium on
Print_ISBN
0-7803-9266-3
Type
conf
DOI
10.1109/ISPACS.2005.1595346
Filename
1595346
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