• DocumentCode
    3272512
  • Title

    Fringe pattern profilometry based on inverse function analysis

  • Author

    Hu, Yingsong ; Xi, Jiangtao ; Li, Enbang ; Chicharo, Joe ; Yang, Zongkai

  • Author_Institution
    ScHoo of Electr. Comput. & Telecommun. Eng., Wollongong Univ., NSW, Australia
  • fYear
    2005
  • fDate
    13-16 Dec. 2005
  • Firstpage
    61
  • Lastpage
    64
  • Abstract
    In this paper, we proposed a new algorithm, referred to as inverse function analysis (IFA) method based on the derived mathematical model to reconstruct 3-D surfaces using fringe pattern profilometry (FPP) technique. Compared with traditional methods, our algorithm has neither the requirement for the structure of projected fringe patterns, nor the prior knowledge of the characteristics of projection systems. The correctness of inverse function analysis (IFA) method has been confirmed by simulation results. It can be seen that the measurement accuracy has been significantly improved by inverse function analysis (IFA) method, especially when the expected sinusoidal fringe patterns are distorted by unknown nonlinear factors.
  • Keywords
    image reconstruction; 3D surface reconstruction; fringe pattern profilometry; inverse function analysis; Charge coupled devices; Charge-coupled image sensors; Distortion measurement; Gratings; Image analysis; Image reconstruction; Information analysis; Mathematical model; Pattern analysis; Surface reconstruction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Signal Processing and Communication Systems, 2005. ISPACS 2005. Proceedings of 2005 International Symposium on
  • Print_ISBN
    0-7803-9266-3
  • Type

    conf

  • DOI
    10.1109/ISPACS.2005.1595346
  • Filename
    1595346