A Novel Dynamic Current Analysis for ADC Testing

The increasing importance of mixed-signal circuits has brought about a new important issue in testing this kind of circuits. Nevertheless, these techniques are difficult and costly. In an attempt to promote mixed-signal circuits testing, a novel fault detection method is presented in this paper. This method uses wavelet transform based dynamic current (I_dd) analysis to detect the faults. The experimental results for an ADC circuit show that the proposed method not only can effectively detect faults, but also have higher sensitivity than integral and FFT method. Furthermore, the impact of different mother wavelet on the sensitivity of fault detection is addressed