• DocumentCode
    3272636
  • Title

    Sub-wavelength imaging of terahertz dielectric permittivity using planar resonant circuits

  • Author

    Byrne, M.B. ; Cunningham, J.E. ; Khanna, S.P. ; Stringer, M.R. ; Wood, C.D. ; Linfield, E.H. ; Davies, A.G.

  • Author_Institution
    Sch. of Electron. & Electr. Eng., Univ. of Leeds, Leeds
  • fYear
    2008
  • fDate
    15-19 Sept. 2008
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    A new technique for quantitative sub-wavelength mapping of terahertz dielectric permittivity is demonstrated, using on-chip resonant terahertz filters. Imaging results on etched semiconductor samples show the viability of the technique, and future applications are discussed.
  • Keywords
    III-V semiconductors; etching; gallium arsenide; permittivity measurement; submillimetre wave filters; submillimetre wave imaging; GaAs; etched semiconductor samples; on-chip resonant terahertz filters; planar resonant circuits; sub-wavelength imaging; sub-wavelength mapping; terahertz dielectric permittivity; Dielectrics; Etching; Frequency; Gallium arsenide; Optical filters; Optical imaging; Permittivity; RLC circuits; Resonance; Submillimeter wave filters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Infrared, Millimeter and Terahertz Waves, 2008. IRMMW-THz 2008. 33rd International Conference on
  • Conference_Location
    Pasadena, CA
  • Print_ISBN
    978-1-4244-2119-0
  • Electronic_ISBN
    978-1-4244-2120-6
  • Type

    conf

  • DOI
    10.1109/ICIMW.2008.4665423
  • Filename
    4665423
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3272636