Title :
Sub-wavelength imaging of terahertz dielectric permittivity using planar resonant circuits
Author :
Byrne, M.B. ; Cunningham, J.E. ; Khanna, S.P. ; Stringer, M.R. ; Wood, C.D. ; Linfield, E.H. ; Davies, A.G.
Author_Institution :
Sch. of Electron. & Electr. Eng., Univ. of Leeds, Leeds
Abstract :
A new technique for quantitative sub-wavelength mapping of terahertz dielectric permittivity is demonstrated, using on-chip resonant terahertz filters. Imaging results on etched semiconductor samples show the viability of the technique, and future applications are discussed.
Keywords :
III-V semiconductors; etching; gallium arsenide; permittivity measurement; submillimetre wave filters; submillimetre wave imaging; GaAs; etched semiconductor samples; on-chip resonant terahertz filters; planar resonant circuits; sub-wavelength imaging; sub-wavelength mapping; terahertz dielectric permittivity; Dielectrics; Etching; Frequency; Gallium arsenide; Optical filters; Optical imaging; Permittivity; RLC circuits; Resonance; Submillimeter wave filters;
Conference_Titel :
Infrared, Millimeter and Terahertz Waves, 2008. IRMMW-THz 2008. 33rd International Conference on
Conference_Location :
Pasadena, CA
Print_ISBN :
978-1-4244-2119-0
Electronic_ISBN :
978-1-4244-2120-6
DOI :
10.1109/ICIMW.2008.4665423
