• DocumentCode
    3272752
  • Title

    Nonparametric permutation tests versus parametric tests in radar detection under k-distributed clutter

  • Author

    González-García, José E. ; Sanz-González, José L. ; Álvarez-Vaquero, Francisco

  • Author_Institution
    Telecommun. Eng., Madrid Polytech Univ., Spain
  • fYear
    2005
  • fDate
    9-12 May 2005
  • Firstpage
    250
  • Lastpage
    255
  • Abstract
    Permutation detectors (tests) are nonparametric CFAR (constant false-alarm rate) detectors if clutter samples are independent and identically distributed (IID). The optimum statistic for the parametric detector is also optimum for the permutation detector. In this paper, we analyze the performance of some permutation tests (PTs) under an ideal k-distributed clutter model and nonfluctuating (NF) and Swerling II (SW-II) target models. Also, we compare the PTs results against their parametric counterparts under the same conditions. We analyze the detector performances in terms of detection probability (Pd) versus signal-to-clutter ratio (SCR) for different parameter values: the number of integrated pulses (N), the clutter reference samples (M), the false alarm probability (Pfa) and the shape parameter (v) of the k-distributed clutter. The conclusions obtained from the analysis of the different results are discussed.
  • Keywords
    probability; radar clutter; radar detection; radar signal processing; Rayleigh clutter; clutter reference samples; constant false-alarm rate; detection probability; false alarm probability; integrated pulses; k-distributed clutter; nonparametric permutation tests; optimum parametric test statistic; optimum statistic; parametric tests; permutation detector; radar detection; signal-to-clutter ratio; spiky clutter; Clutter; Detectors; Noise measurement; Parametric statistics; Performance analysis; Radar detection; Signal analysis; Statistical distributions; Testing; Thyristors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radar Conference, 2005 IEEE International
  • Print_ISBN
    0-7803-8881-X
  • Type

    conf

  • DOI
    10.1109/RADAR.2005.1435829
  • Filename
    1435829