DocumentCode
3272871
Title
A High-Performance Foldback Current Limiting Circuit for Improving Regulators´ Latch-up Effect
Author
Xiaojie, Cheng ; Xin, Wu
Author_Institution
Res. Inst., CETC, Guangzhou
Volume
4
fYear
2006
fDate
25-28 June 2006
Firstpage
2248
Lastpage
2250
Abstract
An over-current protection circuit for improving the integrated regulators´ latch-up effect is proposed. Latch-up effect can be eliminated through combining foldback function with constant current limiting function which could change the slope of the foldback current curve to avoid intersecting the static load line. With normal 0.6 mum CMOS process, the feasibility and reliability of the circuit was proved
Keywords
CMOS integrated circuits; circuit reliability; current limiters; overcurrent protection; 0.6 micron; 0.6 mum CMOS process; circuit reliability; current limiting circuit; foldback function; integrated regulators latch-up effect; over-current protection circuit; Automobiles; CMOS process; Circuits; Current limiters; Equations; MOSFETs; Power dissipation; Protection; Regulators; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Communications, Circuits and Systems Proceedings, 2006 International Conference on
Conference_Location
Guilin
Print_ISBN
0-7803-9584-0
Electronic_ISBN
0-7803-9585-9
Type
conf
DOI
10.1109/ICCCAS.2006.285125
Filename
4064372
Link To Document