DocumentCode :
3272968
Title :
Challenges and solution approaches for the online simulation of semiconductor wafer fabs
Author :
Noack, Daniel ; Mosinski, Marcin ; Rose, Oliver ; Lendermann, Peter ; Gan, Boon Ping ; Scholl, Wolfgang
Author_Institution :
Inst. of Appl. Comput. Sci., Dresden Univ. of Technol., Dresden, Germany
fYear :
2011
fDate :
11-14 Dec. 2011
Firstpage :
1840
Lastpage :
1851
Abstract :
To make use of short-term simulation on an operational level, three aspects are essential. First, the simulation model needs to have a high level of detail to represent a small part of the wafer fab with sufficient precision. Second, the simulation model needs to be initialized very well with the current fab state. And third, the simulation results need to be available very fast, almost in real time. Unfortunately these conditions contradict each other. In particular, it takes a large amount of time to initialize a high precision full fab simulation model because of the huge amount of data. In this paper, we present the prototype of a fab driven simulation approach to overcome these time consuming limitations. We will show how it is possible to start a short-term simulation from the current fab state immediately, i.e., without further delay.
Keywords :
production engineering computing; semiconductor technology; fab driven simulation approach; online semiconductor wafer fab simulation; short-term simulation model; Data mining; Data models; Gallium nitride; Load modeling; Real time systems; Semiconductor device modeling; Synchronization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Simulation Conference (WSC), Proceedings of the 2011 Winter
Conference_Location :
Phoenix, AZ
ISSN :
0891-7736
Print_ISBN :
978-1-4577-2108-3
Electronic_ISBN :
0891-7736
Type :
conf
DOI :
10.1109/WSC.2011.6147898
Filename :
6147898
Link To Document :
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