• DocumentCode
    3273132
  • Title

    Generalized average modelling of FACTS for real time simulation in ARENE

  • Author

    Etxeberria-Otadui, I. ; Manzo, Vincent ; Bacha, Seddik ; Baltès, Frédéric

  • Author_Institution
    IKERLAN, Mondragon, Spain
  • Volume
    2
  • fYear
    2002
  • fDate
    5-8 Nov. 2002
  • Firstpage
    864
  • Abstract
    This paper studies two cutting edge technologies applied to the power system: FACTS devices and real time (RT) simulation tools. On the one hand, the complexity of the power system and its components, makes power system simulators very useful and even necessary. Amongst all the existing simulators, real time digital simulators permit the test of power system components in conditions that are quite close to reality. On the other hand power electronic devices such as FACTS, are becoming more and more frequent on the power system, and it is necessary to evaluate their impact on the performance of the system. For all these reasons it is very important to develop FACTS models which can be suitable for real time simulation in order to test their interaction with other power system components. This paper presents the generalized average model of two FACTS devices the static VAr compensator (SVC) and the static VAr generator, which have been then introduced in ARENE for the realization of real time simulations.
  • Keywords
    digital simulation; flexible AC transmission systems; power system simulation; real-time systems; software packages; static VAr compensators; ARENE; FACTS; cutting edge technologies; generalized average modelling; hand power electronic devices; power system; power system components testing; power system simulators; real time digital simulators; real time simulation; real time simulation tools; static VAr compensator; static VAr generator; Analytical models; Power electronics; Power system analysis computing; Power system dynamics; Power system modeling; Power system planning; Power system simulation; Real time systems; Static VAr compensators; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IECON 02 [Industrial Electronics Society, IEEE 2002 28th Annual Conference of the]
  • Print_ISBN
    0-7803-7474-6
  • Type

    conf

  • DOI
    10.1109/IECON.2002.1185385
  • Filename
    1185385