DocumentCode :
3273205
Title :
Depth map inpainting and super-resolution based on internal statistics of geometry and appearance
Author :
Ikehata, Satoshi ; Ji-Ho Cho ; Aizawa, K.
Author_Institution :
Univ. of Tokyo, Tokyo, Japan
fYear :
2013
fDate :
15-18 Sept. 2013
Firstpage :
938
Lastpage :
942
Abstract :
Depth maps captured by multiple sensors often suffer from poor resolution and missing pixels caused by low reflectivity and occlusions in the scene. To address these problems, we propose a combined framework of patch-based inpainting and super-resolution. Unlike previous works, which relied solely on depth information, we explicitly take advantage of the internal statistics of a depth map and a registered highresolution texture image that capture the same scene. We account these statistics to locate non-local patches for hole filling and constrain the sparse coding-based super-resolution problem. Extensive evaluations are performed and show the state-of-the-art performance when using real-world datasets.
Keywords :
image coding; image resolution; image sensors; image texture; statistical analysis; depth information; depth map inpainting; hole filling; internal geometry statistics; multiple sensors; nonlocal patches; patch-based inpainting; registered high-resolution texture image; sparse coding-based super-resolution problem; super-resolution; Bayes methods; Computer vision; Geometry; Image reconstruction; Image resolution; Signal resolution; ToF sensor; depth-map inpainting; depth-map super-resolution; sparse Bayesian learning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing (ICIP), 2013 20th IEEE International Conference on
Conference_Location :
Melbourne, VIC
Type :
conf
DOI :
10.1109/ICIP.2013.6738194
Filename :
6738194
Link To Document :
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