• DocumentCode
    3273373
  • Title

    Real Time Dispatching - a catalyst to Assembly Test manufacturing execution automation

  • Author

    Iyer, Bala ; Dash, Binay

  • Author_Institution
    ATTD Autom., Intel Corp., Chandler, AZ, USA
  • fYear
    2011
  • fDate
    11-14 Dec. 2011
  • Firstpage
    2062
  • Lastpage
    2067
  • Abstract
    Intel´s Assembly Test (AT) factories have long relied on legacy applications for lot kitting out of inventory locations. The accuracy, usability and product enhancement cycle times of these applications were constrained by data latency, inflexibility in business rule implementation and maintenance. To address these issues we successfully leveraged the Real Time Dispatching (RTD) application framework to provide a variety of kitting capabilities. We describe these projects and the new capabilities enabled through the use of the RTD framework in this paper.
  • Keywords
    assembling; dispatching; integrated circuit manufacture; inventory management; lot sizing; production engineering computing; production facilities; Intel assembly test factory; assembly test manufacturing execution automation; business rule implementation; business rule maintenance; data latency; inventory location; legacy application; lot kitting; product enhancement cycle time; realtime dispatching application framework; Assembly; Business; Materials; Production facilities; Real time systems; User interfaces;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation Conference (WSC), Proceedings of the 2011 Winter
  • Conference_Location
    Phoenix, AZ
  • ISSN
    0891-7736
  • Print_ISBN
    978-1-4577-2108-3
  • Electronic_ISBN
    0891-7736
  • Type

    conf

  • DOI
    10.1109/WSC.2011.6147919
  • Filename
    6147919