Title :
Real Time Dispatching - a catalyst to Assembly Test manufacturing execution automation
Author :
Iyer, Bala ; Dash, Binay
Author_Institution :
ATTD Autom., Intel Corp., Chandler, AZ, USA
Abstract :
Intel´s Assembly Test (AT) factories have long relied on legacy applications for lot kitting out of inventory locations. The accuracy, usability and product enhancement cycle times of these applications were constrained by data latency, inflexibility in business rule implementation and maintenance. To address these issues we successfully leveraged the Real Time Dispatching (RTD) application framework to provide a variety of kitting capabilities. We describe these projects and the new capabilities enabled through the use of the RTD framework in this paper.
Keywords :
assembling; dispatching; integrated circuit manufacture; inventory management; lot sizing; production engineering computing; production facilities; Intel assembly test factory; assembly test manufacturing execution automation; business rule implementation; business rule maintenance; data latency; inventory location; legacy application; lot kitting; product enhancement cycle time; realtime dispatching application framework; Assembly; Business; Materials; Production facilities; Real time systems; User interfaces;
Conference_Titel :
Simulation Conference (WSC), Proceedings of the 2011 Winter
Conference_Location :
Phoenix, AZ
Print_ISBN :
978-1-4577-2108-3
Electronic_ISBN :
0891-7736
DOI :
10.1109/WSC.2011.6147919