DocumentCode :
3273421
Title :
Integrated Substrate Technology
Author :
Chanchani, Rajen ; Bethke, Donald T. ; Webb, Denise B. ; Sandoval, Charlie ; Wouters, Gregg
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
Volume :
2
fYear :
2004
fDate :
1-4 June 2004
Firstpage :
1232
Abstract :
Advanced micro-systems for national security needs will require miniaturization and integration of RF, digital, and analog electronics, optics and MEMS on a single substrate. To meets these demands we have developed an integrated substrate technology using Benzocyclobutene (BCB)/copper (Cu) with embedded thin film passive components. We have developed processes to fabricate BCB/Cu multilayer stack on silicon (Si), alumina (Al2O3) and Low Temperature Co-fired Ceramic (LTCC) wafers. A multi-layer stack of 6 metal layers and 5 BCB layers using 5-micron and 10-micron thick photodefinable BCB dielectric and 2 to 3-micron thick Cu conductor have been demonstrated. The design rules for minimum featured size used were 30-micron vias on 50-micron pitch and 25-micron wide line´s on 40-micron pitch. We have also fabricated embedded inductors, in-plane and in 3-dimension, ranging in values from 750 pH to 42 nH, embedded TaN thin-film resistors with DC values ranging from 10 Ohms to 10 KOhms and embedded capacitors ranging in values from 48 pF to 110 nF measured at 1 MHz and 100 MHz. We have designed, fabricated, characterized and- simulated micro-strip lines in a RF module. The transmission losses range from 0.021 to 0.114 dB/mm. The return losses are 25.5 dB to 41 dB and VSWR range from 1.018 to 1.111. We are currently developing the next generation of miniaturized circuits called Integrated System-On-A-Chip. In this technology, Integrated Substrate Technology will be used to stack wafers in 3-D and to make electrical connections through the stacked wafers.
Keywords :
capacitors; copper; inductors; interconnections; microstrip circuits; multichip modules; substrates; thin film resistors; BCB/Cu multilayer stack; Cu; LTCC wafers; RF module; advanced microsystems; alumina wafers; design rules; embedded capacitors; embedded inductors; embedded thin film passive components; embedded thin-film resistors; integrated substrate technology; integrated system-on-a-chip; interconnection density; metal conductors; microstrip lines; minimum featured size; polymer thin-film dielectric; return losses; silicon wafers; substrate size; transmission losses; Copper; Integrated circuit technology; Integrated optics; Micromechanical devices; National security; Optical films; Radio frequency; Substrates; Thin film inductors; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2004. Proceedings. 54th
Print_ISBN :
0-7803-8365-6
Type :
conf
DOI :
10.1109/ECTC.2004.1320271
Filename :
1320271
Link To Document :
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