DocumentCode :
3273498
Title :
Development of statistical parameter measuring equipment
Author :
Shinozuka, Takashi
Author_Institution :
Electromagn. Compatibility Res. Labs. Co. Ltd., Sendai, Japan
fYear :
1999
fDate :
1999
Firstpage :
792
Abstract :
A statistical parameter of disturbance is effective to estimate BER degradation of a digital link due to the disturbance. For the statistical parameter, an amplitude probability distribution (APD) gives a characteristic of the amplitude domain of the disturbance, and, furthermore, a crossing rate distribution (CRD) and a pulse duration distribution (PDD) give time domain characteristics. It has been reported that BER degradation of a digital link such as PHS or PDC due to disturbances emitted from microwave ovens can be estimated from the APD data of the disturbance. It is also necessary to obtain the CRD and PDD data of disturbance in order to make a digital link which has countermeasures against burst noise by using interleave techniques, etc. In this paper, APD/CRD/PDD measuring equipment is introduced and demonstrated
Keywords :
digital communication; electromagnetic compatibility; electromagnetic interference; error statistics; measurement systems; APD/CRD/PDD measuring equipment; BER degradation; EMC; PDC; PHS; amplitude domain characteristics; amplitude probability distribution; burst noise; crossing rate distribution; digital link; disturbance; interleave techniques; microwave ovens; pulse duration distribution; statistical parameter measuring equipment development; time domain characteristics; Bit error rate; Counting circuits; Degradation; Electromagnetic compatibility; Electromagnetic measurements; Instruction sets; Laboratories; Microwave ovens; Probability distribution; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 1999 International Symposium on
Conference_Location :
Tokyo
Print_ISBN :
4-9980748-4-9
Type :
conf
DOI :
10.1109/ELMAGC.1999.801451
Filename :
801451
Link To Document :
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