DocumentCode :
3273524
Title :
[Front cover]
fYear :
2007
fDate :
26-30 Aug. 2007
Abstract :
The following topics are dealt with: non-volatile memory; NAND Flash memory; memory reliability; MRAM; nanoscale resistive memory device; Flash EEPROM and memory programming.
Keywords :
NAND circuits; circuit reliability; flash memories; microprogramming; nanoelectronics; random-access storage; Flash EEPROM; MRAM; NAND Flash memory; memory programming; memory reliability; nanoscale resistive memory device; non-volatile semiconductor memory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Non-Volatile Semiconductor Memory Workshop, 2007 22nd IEEE
Conference_Location :
Monterey, CA
Print_ISBN :
1-4244-0752-4
Type :
conf
DOI :
10.1109/NVSMW.2007.4290554
Filename :
4290554
Link To Document :
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