Title :
High drop test reliability: lead-free solders
Author :
Amagai, Masazumi ; Toyoda, Yoshitaka ; Ohnishi, Tsukasa ; Akita, Satom
Author_Institution :
Tsukuba Technol. Center, Texas Instruments, Ibaraki, Japan
Abstract :
Recently, preventing environmental pollution, lead-free (Pb-free) solders are about to replace tin-lead (Sn-Pb) eutectic solders. Sn-Ag-Cu alloys are leading candidates for lead free solders. Sn-Ag-Cu-P was developed last year, but Sn-Ag-Cu-P alloys were not satisfactory to meet severe customer requirements like thermal aging process followed by drop tests. To improve drop test performance after the thermal aging process, a combination of indium and nickel was investigated. After the effect of indium and nickel on Kirkendall voids and Cu3Sn growth thickness was studied, the weight ratio of indium to nickel was optimized. Based on the results of board level reliability tests, a new lead free solder has been developed. This paper presents the optimum nickel and indium included in Sn-Ag-Cu based solder alloys.
Keywords :
ageing; chemical interdiffusion; circuit reliability; copper alloys; impact testing; indium alloys; nickel alloys; silver alloys; solders; tin alloys; voids (solid); Cu3Sn; Kirkendall voids; SnAgCuInNi; SnAgCuP; board level reliability tests; drop tests; eutectic solders; lead-free solders; solder high drop test reliability; thermal aging process; Aging; Environmentally friendly manufacturing techniques; Indium; Intermetallic; Lead; Metals industry; Nickel; Packaging; Soldering; Testing;
Conference_Titel :
Electronic Components and Technology Conference, 2004. Proceedings. 54th
Print_ISBN :
0-7803-8365-6
DOI :
10.1109/ECTC.2004.1320281