Title :
Estimation of range-dependent clutter covariance by configuration system parameter estimation
Author :
Jaffer, Amin G. ; Himed, Braham ; Ho, Phuoc T.
Author_Institution :
Raytheon Space & Airborne Syst., El Segundo, CA, USA
Abstract :
The range-dependent nature of the surface clutter power spectrum observed in monostatic or bistatic airborne radar systems results in a mismatch of the clutter covariance matrix (computed from a secondary set of range-cell data) relative to that of a possible target test cell, with attendant degradation of space-time adaptive processing (STAP) performance. In this paper, we develop a new method for predicting the test cell clutter covariance matrix by estimating the configuration system parameters that directly influence the clutter power spectrum. The method uses a multiple complex sinusoid model whose parameters are related to the configuration system parameters, which are then optimized to match the radar return pulse-train data in a least-squares sense. The estimated configuration parameters are then used to predict the clutter covariance matrix in the test cell, which is then used with traditional STAP methods. Computer simulation results are presented that demonstrate the significantly improved STAP performance obtained by the method developed here compared to the conventional method of using the sample covariance matrix estimated from secondary data.
Keywords :
airborne radar; covariance matrices; least squares approximations; parameter estimation; radar clutter; radar signal processing; space-time adaptive processing; bistatic airborne radar systems; clutter covariance matrix; complex sinusoid model; configuration system parameter estimation; least-squares method; monostatic airborne radar systems; radar return pulse-train data; range-dependent clutter covariance estimation; space-time adaptive processing; surface clutter power spectrum; Airborne radar; Clutter; Covariance matrix; Degradation; Military computing; Motion estimation; Parameter estimation; Radar detection; System testing; Transmitters;
Conference_Titel :
Radar Conference, 2005 IEEE International
Print_ISBN :
0-7803-8881-X
DOI :
10.1109/RADAR.2005.1435868