• DocumentCode
    3273719
  • Title

    Aging and creep behavior of Sn3.9Ag0.6Cu solder alloy

  • Author

    Xiao, Qiang ; Nguyen, Luu ; Armstrong, William D.

  • Author_Institution
    Dept. of Mech. Eng., Wyoming Univ., Laramie, WY, USA
  • Volume
    2
  • fYear
    2004
  • fDate
    1-4 June 2004
  • Firstpage
    1325
  • Abstract
    Aging effects and creep behavior along with microstructure changes in eutectic PbSn and the lead-free solder alloy Sn3.9Ag0.6Cu were studied. The room temperature aged Sn3.9Ag0.6Cu alloy continually age-softened due to the growth of relatively large tin-rich crystals. The 180°C aged Sn3.9Ag0.6Cu alloy initially age-softened, and the minimum flow strength was reached after one day at 180°C. This softening correlated with the growth of relatively large tin-rich crystals and with the coarsening of Ag3Sn particles. When aged at 180°C beyond one day the Sn3.9Ag0.6Cu alloy age-hardened corresponding to the dispersion of Ag3Sn particles into tin-rich crystals which previously had not contained intermetallic precipitates. The Sn3.9Ag0.6Cu alloy showed much lower absolute creep rates than the PbSn eutectic. This extreme increase in creep resistance may result from finely dispersed IMC precipitates in the tin matrix. The β-Sn dendrites after creep appear to have some orientational features (aligned at approximately 45° to the flow direction). The size and distributions of IMC is somewhat coarsened with increasing creep temperature. A number of coarsened precipitates of Cu6Sn5 segregate around the β-Sn grain boundary. The simple power-law model was found inapplicable to the whole stress regime for both types of alloy. In addition, two hyperbolic-sine models were developed to describe the creep behavior of both alloys.
  • Keywords
    ageing; copper alloys; creep; crystal microstructure; eutectic alloys; lead alloys; silver alloys; softening; solders; tin alloys; 180 degC; 293 to 298 K; Ag3Sn; Cu6Sn5; PbSn; SnAgCu; age-softening; creep resistance; dendrite orientational alignment; eutectic lead-free solder; finely dispersed IMC precipitates; flow strength; grain boundary; hyperbolic-sine models; intermetallic precipitates; microstructure changes; solder alloy aging behavior; solder alloy creep behavior; tin-rich crystal growth; Aging; Creep; Crystal microstructure; Environmentally friendly manufacturing techniques; Grain boundaries; Intermetallic; Lead; Softening; Temperature distribution; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2004. Proceedings. 54th
  • Print_ISBN
    0-7803-8365-6
  • Type

    conf

  • DOI
    10.1109/ECTC.2004.1320284
  • Filename
    1320284