• DocumentCode
    3273825
  • Title

    The Application of a New Process Method for End Effects of EMD in the Insulator State Diagnosis

  • Author

    Xueming, Zhai ; Ling, Li ; Yongli, Zhu ; Lamei, Li

  • Author_Institution
    Sch. of Comput. Sci. & Technol., North China Electr. Power Univ. (NCEPU), Baoding, China
  • Volume
    2
  • fYear
    2009
  • fDate
    15-17 May 2009
  • Firstpage
    764
  • Lastpage
    767
  • Abstract
    The current signal of the dirty high-voltage is non-stationary signals, which contains rich characteristics and the extent of the information of the insulator flashover, in order to accurately extract these features we can use Hilbert-Huang transformation (HHT) method which has developed in recent years. EMD is the core of it, but as a new signal processing methods, in addition to the need for further proof of the theory of things, it still has many areas for improvement. The end effect is one of the issues which is needed to be resolved immediately. Therefore, based on the existing methods and synthesis the advantage of the closed-loop mirror extension method and the general increasing in extreme point, then we improve these methods for our using. Then we use the combination of symmetrical extension of extreme points and the new improved no-overshoot cubic spline fitting algorithm to improve the EMD algorithm. Finally, we use an example to verify the effectiveness of the method.
  • Keywords
    flashover; insulators; signal processing; splines (mathematics); EMD; Hilbert-Huang transformation; closed-loop mirror extension method; cubic spline fitting algorithm; insulator flashover; insulator state diagnosis; signal processing methods; Data mining; Feature extraction; Flashover; Insulation; Mirrors; Signal processing; Signal processing algorithms; Signal resolution; Signal synthesis; Spline; Border issues; EMD; Extreme point prolongation symmetry; No overshoot cubic spline fitting; Non-stationary signals;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Technology and Applications, 2009. IFITA '09. International Forum on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-0-7695-3600-2
  • Type

    conf

  • DOI
    10.1109/IFITA.2009.441
  • Filename
    5231476