• DocumentCode
    3273830
  • Title

    Calculating the Effective Capacitance for Interconnect Loads Based on Thevenin Model

  • Author

    Fang, Shuai ; Huang, Zhangcai ; Kurokawa, Akira ; Inoue, Yasuaki

  • Author_Institution
    Graduate Sch. of Inf., Production & Syst., Waseda Univ., Fukuoka
  • Volume
    4
  • fYear
    2006
  • fDate
    25-28 June 2006
  • Firstpage
    2474
  • Lastpage
    2477
  • Abstract
    Interconnect wires give large influences on circuit delay in very deep submicron designs. Thevenin model and effective capacitance Ceff concept are usually used to calculate the delay of gate with interconnect loads. In the researches before, the condition that the charges transferred to Ceff and RC-pi are not equal was not considered. With the progress of IC process technology, its influence on static timing analysis becomes larger. In this paper, we consider this condition, and propose an new algorithm for calculating the effective capacitance based on Thevenin model. Experimental results show that it is in agreement with the Spice simulation
  • Keywords
    capacitance measurement; integrated circuit design; integrated circuit interconnections; IC process technology; Spice simulation; Thevenin model; effective capacitance calculation; interconnect loads; Capacitance; Circuit simulation; Delay effects; Integrated circuit interconnections; Integrated circuit technology; Production systems; Semiconductor device modeling; Timing; Voltage; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications, Circuits and Systems Proceedings, 2006 International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    0-7803-9584-0
  • Electronic_ISBN
    0-7803-9585-9
  • Type

    conf

  • DOI
    10.1109/ICCCAS.2006.285176
  • Filename
    4064423