DocumentCode
3273830
Title
Calculating the Effective Capacitance for Interconnect Loads Based on Thevenin Model
Author
Fang, Shuai ; Huang, Zhangcai ; Kurokawa, Akira ; Inoue, Yasuaki
Author_Institution
Graduate Sch. of Inf., Production & Syst., Waseda Univ., Fukuoka
Volume
4
fYear
2006
fDate
25-28 June 2006
Firstpage
2474
Lastpage
2477
Abstract
Interconnect wires give large influences on circuit delay in very deep submicron designs. Thevenin model and effective capacitance Ceff concept are usually used to calculate the delay of gate with interconnect loads. In the researches before, the condition that the charges transferred to Ceff and RC-pi are not equal was not considered. With the progress of IC process technology, its influence on static timing analysis becomes larger. In this paper, we consider this condition, and propose an new algorithm for calculating the effective capacitance based on Thevenin model. Experimental results show that it is in agreement with the Spice simulation
Keywords
capacitance measurement; integrated circuit design; integrated circuit interconnections; IC process technology; Spice simulation; Thevenin model; effective capacitance calculation; interconnect loads; Capacitance; Circuit simulation; Delay effects; Integrated circuit interconnections; Integrated circuit technology; Production systems; Semiconductor device modeling; Timing; Voltage; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Communications, Circuits and Systems Proceedings, 2006 International Conference on
Conference_Location
Guilin
Print_ISBN
0-7803-9584-0
Electronic_ISBN
0-7803-9585-9
Type
conf
DOI
10.1109/ICCCAS.2006.285176
Filename
4064423
Link To Document