Title :
Tribological studies of storage media by atomic force microscopy
Author :
Mate, C.M. ; Lorenz, M.R. ; Novotny, V. ; Sanders, I.L. ; Lin, L.J.
Author_Institution :
IBM Almaden Research Center
Keywords :
Atomic force microscopy; Atomic measurements; Force measurement; Lubricants; Rough surfaces; Silicon; Surface morphology; Surface roughness; Surface topography; Thickness measurement;
Conference_Titel :
Magnetics Conference, 1989. Digests of INTERMAG '89., International
Conference_Location :
Washington, DC, USA
DOI :
10.1109/INTMAG.1989.690149
