Title : 
Terahertz plasmonic random metamaterial
         
        
            Author : 
Elezzabi, A.Y. ; Chau, K.J. ; Maraghechi, P. ; Baron, C.
         
        
            Author_Institution : 
Dept. of Electr. & Comput. Eng., Univ. of Alberta, Edmonton, AB
         
        
        
        
        
        
            Abstract : 
We explore the terahertz electromagnetic properties of a composite metamaterial consisting of subwavelength-sized dielectric particles with metallic inclusions. We observe group refractive index exhibits atypical which cannot be explained by conventional effective medium theory. It is shown to arise from near-field particle-plasmon coupling between the metallic particles. Moreover, we provide evidence of electron spin-dependent terahertz plasmonic transport through both ferromagnetic and ferromagnetic/nonmagnetic metamaterials.
         
        
            Keywords : 
cobalt; composite materials; electromagnetism; ferromagnetic materials; metamaterials; plasmonics; plasmons; refractive index; sapphire; terahertz spectroscopy; time-domain analysis; Co-Al2O3; composite metamaterials; conventional effective medium theory; electron spin-dependent terahertz plasmonic transport; ferromagnetic metamaterials; ferromagnetic-nonmagnetic metamaterials; metallic inclusions; metallic particles; near-field particle-plasmon coupling; refractive index; subwavelength-sized dielectric particles; terahertz electromagnetic properties; terahertz plasmonic random metamaterial; terahertz time-domain spectroscopy; Dielectrics; Electromagnetic radiation; Electrons; Magnetic materials; Metamaterials; Optical attenuators; Optical refraction; Optical variables control; Plasmons; Refractive index;
         
        
        
        
            Conference_Titel : 
Infrared, Millimeter and Terahertz Waves, 2008. IRMMW-THz 2008. 33rd International Conference on
         
        
            Conference_Location : 
Pasadena, CA
         
        
            Print_ISBN : 
978-1-4244-2119-0
         
        
            Electronic_ISBN : 
978-1-4244-2120-6
         
        
        
            DOI : 
10.1109/ICIMW.2008.4665496