Title :
A low temperature wafer-level hermetic MEMS package using UV curable adhesive
Author :
Liang, Zhi-Hao ; Cheng, Y.T. ; Hsu, W. ; Lee, Yuh-Wen
Author_Institution :
Dept. of Mech. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Abstract :
In order to lower the packaging cost and resolve the process complexity of MEMS fabrications, a new wafer-level post-process hermetic package using UV curable adhesive bonding is introduced for MEMS applications. The UV curable adhesive is cured through UV light exposure without any additional heating, suitable for packaging the devices with temperature sensitive materials or processes. A Pyrex 7740 glass is micromachined and used as a protection cap substrate with microcavities which is spin-coated with the adhesive, aligned, and bonded with a device substrate to form the package after the UV curing. Finally, electrical contact pads expose and die separation are done simultaneously by dicing. Two different monitoring devices, dew point sensor and capacitive accelerometer are built to evaluate the package strength and hermeticity. After dicing operation, no structure damage or stiction phenomenon is found in the packaged capacitive accelerometer. Furthermore, no moisture condensation is observed in the package with 190 μm bonding width after 150 minutes boil water immersion. The acceleration test results indicate the package can survive more than 3 weeks at 25°C, 100% RH (relative humidity) working environment.
Keywords :
accelerometers; adhesives; boiling; curing; hermetic seals; humidity; life testing; micromachining; micromechanical devices; microsensors; plastic packaging; semiconductor device packaging; ultraviolet radiation effects; 150 min; 190 micron; 25 C; 3 week; MEMS fabrications; Pyrex 7740 glass protection cap; UV curable adhesive bonding; UV curing; UV light exposure; acceleration test; boil water immersion; capacitive accelerometer; device substrate; dew point sensor; dicing; die separation; electrical contact pads; low temperature wafer-level hermetic MEMS package; microcavities; moisture condensation; monitoring devices; package bonding width; package hermeticity; package strength; packaging cost; process complexity; relative humidity; spin-coated adhesive; stiction; structure damage; temperature sensitive materials; temperature sensitive processes; wafer-level post-process hermetic package; working environment; Accelerometers; Costs; Fabrication; Glass; Heating; Micromechanical devices; Packaging; Temperature sensors; Wafer bonding; Wafer scale integration;
Conference_Titel :
Electronic Components and Technology Conference, 2004. Proceedings. 54th
Print_ISBN :
0-7803-8365-6
DOI :
10.1109/ECTC.2004.1320311