• DocumentCode
    3274213
  • Title

    A low temperature wafer-level hermetic MEMS package using UV curable adhesive

  • Author

    Liang, Zhi-Hao ; Cheng, Y.T. ; Hsu, W. ; Lee, Yuh-Wen

  • Author_Institution
    Dept. of Mech. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • Volume
    2
  • fYear
    2004
  • fDate
    1-4 June 2004
  • Firstpage
    1486
  • Abstract
    In order to lower the packaging cost and resolve the process complexity of MEMS fabrications, a new wafer-level post-process hermetic package using UV curable adhesive bonding is introduced for MEMS applications. The UV curable adhesive is cured through UV light exposure without any additional heating, suitable for packaging the devices with temperature sensitive materials or processes. A Pyrex 7740 glass is micromachined and used as a protection cap substrate with microcavities which is spin-coated with the adhesive, aligned, and bonded with a device substrate to form the package after the UV curing. Finally, electrical contact pads expose and die separation are done simultaneously by dicing. Two different monitoring devices, dew point sensor and capacitive accelerometer are built to evaluate the package strength and hermeticity. After dicing operation, no structure damage or stiction phenomenon is found in the packaged capacitive accelerometer. Furthermore, no moisture condensation is observed in the package with 190 μm bonding width after 150 minutes boil water immersion. The acceleration test results indicate the package can survive more than 3 weeks at 25°C, 100% RH (relative humidity) working environment.
  • Keywords
    accelerometers; adhesives; boiling; curing; hermetic seals; humidity; life testing; micromachining; micromechanical devices; microsensors; plastic packaging; semiconductor device packaging; ultraviolet radiation effects; 150 min; 190 micron; 25 C; 3 week; MEMS fabrications; Pyrex 7740 glass protection cap; UV curable adhesive bonding; UV curing; UV light exposure; acceleration test; boil water immersion; capacitive accelerometer; device substrate; dew point sensor; dicing; die separation; electrical contact pads; low temperature wafer-level hermetic MEMS package; microcavities; moisture condensation; monitoring devices; package bonding width; package hermeticity; package strength; packaging cost; process complexity; relative humidity; spin-coated adhesive; stiction; structure damage; temperature sensitive materials; temperature sensitive processes; wafer-level post-process hermetic package; working environment; Accelerometers; Costs; Fabrication; Glass; Heating; Micromechanical devices; Packaging; Temperature sensors; Wafer bonding; Wafer scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2004. Proceedings. 54th
  • Print_ISBN
    0-7803-8365-6
  • Type

    conf

  • DOI
    10.1109/ECTC.2004.1320311
  • Filename
    1320311