Title :
On-chip offset generator for A/D converter INL testing without an accurate test stimulus
Author :
Korhonen, Esa ; Kostamovaara, Juha
Author_Institution :
Electron. Lab., Univ. of Oulu, Oulu, Finland
Abstract :
Means of testing the integral nonlinearity (INL) of A/D converters (ADCs) without an accurate test stimulus have recently been proposed. These methods are based on a constant DC offset between two low-quality test signals. We describe here an on-chip offset generator and analyse its limitations. Experimental tests show that it can be used to test the INL of 12-b ADCs.
Keywords :
analogue-digital conversion; circuit testing; signal generators; A-D converters; ADCs; INL testing; integral nonlinearity testing; on-chip offset generator; stimulus identification methods; Built-in self-test; Circuit testing; Electronic equipment testing; Equations; Integrated circuit testing; Laboratories; Linearity; Signal design; Signal generators; Voltage;
Conference_Titel :
NORCHIP, 2009
Conference_Location :
Trondheim
Print_ISBN :
978-1-4244-4310-9
Electronic_ISBN :
978-1-4244-4311-6
DOI :
10.1109/NORCHP.2009.5397847
