Title :
Terahertz spectroscopy of ultrafast carrier dynamics in nanomaterials
Author :
Hegmann, Frank A. ; Cooke, David G. ; Walther, Markus
Author_Institution :
Dept. of Phys., Univ. of Alberta, Edmonton, AB
Abstract :
We use time-resolved terahertz spectroscopy to explore ultrafast carrier dynamics, transport, and localization in photoexcited nanocrystalline silicon films. The measured terahertz conductivity reveals a transition from free to localized behavior as the amount of disorder in the film increases, which is well-described within the framework of the Drude-Smith model.
Keywords :
high-frequency effects; high-speed optical techniques; nanostructured materials; semiconductor thin films; silicon; submillimetre wave spectra; Drude-Smith model; Si; nanomaterials; photoexcited nanocrystalline silicon films; terahertz conductivity; time-resolved terahertz spectroscopy; ultrafast carrier dynamics; Backscatter; Conductive films; Conductivity; Frequency; Nanocrystals; Nanomaterials; Optical films; Semiconductor films; Silicon; Spectroscopy;
Conference_Titel :
Infrared, Millimeter and Terahertz Waves, 2008. IRMMW-THz 2008. 33rd International Conference on
Conference_Location :
Pasadena, CA
Print_ISBN :
978-1-4244-2119-0
Electronic_ISBN :
978-1-4244-2120-6
DOI :
10.1109/ICIMW.2008.4665520
