• DocumentCode
    3274798
  • Title

    Characterization of transfer molding effects on RF performance of power amplifier module

  • Author

    Li, Li ; Kapur, Anju ; Heames, Ken Brice

  • Author_Institution
    Semicond. Products Sector, Motorola Inc., Tempe, AZ, USA
  • Volume
    2
  • fYear
    2004
  • fDate
    1-4 June 2004
  • Firstpage
    1671
  • Abstract
    In this study, impacts of transfer molding material on electrical performance of a Power Amplifier (PA) module for GSM/GPRS mobile phone application were characterized. Critical areas on the module to cause output power (Pout) degradation were identified, which serves as a guidance for design compensation to minimize molding effects. Molding compound dielectric property is an important variable to the molding effects. Therefore, dielectric property measurement techniques and capabilities were established up to 10 GHz. Various molding compound materials from vendors were obtained. Dielectric constant (Dk) and loss tangent (Df) were measured up to 10 GHz. Electromagnetic (EM) simulations on the PA module US PCS band (1850 to 1910 MHz) die output matching physical structures, including Cu transmission lines and MOS capacitors and their wirebonds, bias feeding, and daisy chain coupler before and after molding, were conducted using measured dielectric property data. Simulations show that the most sensitive area to molding are MOS capacitors and their wirebonds, which caused center band frequency shifting 31 MHz lower after molding. Selective glob top encapsulate experiments were conducted on the PA module US PCS band path, and critical areas for power-out (Pout) drop and band frequency shift were identified. MOS capacitors and their wirebonds in the output matching circuit accounted for 58% of total Pout drop after molding, and GaAs die with inter-stage matching passives on and off chip accounted for 22% of total Pout drop. Small signal gain measurements show that pass band center frequency shifted lower after glob top encapsulate the MOS capacitors and their wirebonds, which significantly dropped gain at high frequency edge of 1910 MHz. Design compensation to minimize Pout drop was used to tune module band purposely higher to account for the frequency shift after molding. Next generation die and module design was compensated, and band center was purposely shifted higher.
  • Keywords
    MOS capacitors; S-parameters; UHF power amplifiers; cellular radio; dielectric losses; electronics packaging; permittivity; transceivers; transfer moulding; 1850 to 1910 MHz; GSM/GPRS mobile phone; MOS capacitors; RF front end; RF performance; S-parameter; design compensation; dielectric loss tangent; electromagnetic simulations; glob top encapsulation; molding compound dielectric property; output matching structures; output power degradation; power amplifier module; small signal gain; transfer molding effects; wirebonds; Dielectric loss measurement; Dielectric materials; Dielectric measurements; Electromagnetic measurements; MOS capacitors; Power amplifiers; Radio frequency; Radiofrequency amplifiers; Transfer molding; Transmission line measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2004. Proceedings. 54th
  • Print_ISBN
    0-7803-8365-6
  • Type

    conf

  • DOI
    10.1109/ECTC.2004.1320340
  • Filename
    1320340