Title :
An Efficient VLSI Architecture of Frequency Domain Kurtosis for Non-Stationary Acoustic Noise Measurements
Author :
Lei, Sheau-Fang ; Chiou, Lih-Yih ; Lee, Hsieh-Wei ; Liu, Bin-Da
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan
Abstract :
Recent research shows that the conventional energy-based metrics used for acoustic noise measurements underestimate the hazardous effects of non-stationary noises on hearing conservation practice. New strategies that adopt higher-order statistical metrics to quantify noise measurements are needed to better assess potential damage to hearing. This paper proposes an efficient architecture of the frequency domain kurtosis metric that is a higher-order statistical metric. The architecture emphasizes efficiency on area and time to meet the technological challenges of compactness and portability for the acoustic noise measurement instruments.
Keywords :
VLSI; acoustic equipment; acoustic noise measurement; frequency-domain analysis; hearing; speech intelligibility; statistical analysis; VLSI architecture; acoustic noise measurement instruments; conservation; frequency domain kurtosis; hearing damage; high order statistical metrics; noise measurement quantification; nonstationary acoustic noise measurements; nonstationary noise hazardous effects; Acoustic measurements; Acoustic noise; Area measurement; Auditory system; Energy measurement; Frequency domain analysis; Frequency measurement; Noise measurement; Time measurement; Very large scale integration;
Conference_Titel :
Communications, Circuits and Systems Proceedings, 2006 International Conference on
Conference_Location :
Guilin
Print_ISBN :
0-7803-9584-0
Electronic_ISBN :
0-7803-9585-9
DOI :
10.1109/ICCCAS.2006.285231