• DocumentCode
    3275142
  • Title

    Analytical Thermal Analysis of On-chip Interconnects

  • Author

    Lin, Saihua ; Yang, Huazhong

  • Author_Institution
    Tsinghua Univ., Beijing
  • Volume
    4
  • fYear
    2006
  • fDate
    25-28 June 2006
  • Firstpage
    2776
  • Lastpage
    2780
  • Abstract
    A detailed analytical analysis of the on-chip thermal related problems of interconnects is provided in this paper. By examining and simplifying the power generation mechanism of on-chip devices, compact expressions of the dynamic temperature profile of an interconnect line are derived. It is shown that the temperature profile of the interconnect line has a space-time distribution and thus we propose some new suggestions to floorplanning when considering this effect. The temperature effects on the Power/Ground (P/G) interconnect lines and the Signal interconnect lines are also analyzed. It is shown that the IR drop and the Elmore delay can be increased due to this temperature effect.
  • Keywords
    integrated circuit interconnections; thermal analysis; Elmore delay; IR drop; analytical thermal analysis; on-chip interconnects; power generation mechanism; power/ground interconnect lines; signal interconnect lines; CMOS technology; Energy consumption; Heat transfer; Integrated circuit interconnections; Land surface temperature; Power engineering and energy; Power generation; Temperature distribution; Thermal management; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications, Circuits and Systems Proceedings, 2006 International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    0-7803-9584-0
  • Electronic_ISBN
    0-7803-9585-9
  • Type

    conf

  • DOI
    10.1109/ICCCAS.2006.285244
  • Filename
    4064491