DocumentCode
3275142
Title
Analytical Thermal Analysis of On-chip Interconnects
Author
Lin, Saihua ; Yang, Huazhong
Author_Institution
Tsinghua Univ., Beijing
Volume
4
fYear
2006
fDate
25-28 June 2006
Firstpage
2776
Lastpage
2780
Abstract
A detailed analytical analysis of the on-chip thermal related problems of interconnects is provided in this paper. By examining and simplifying the power generation mechanism of on-chip devices, compact expressions of the dynamic temperature profile of an interconnect line are derived. It is shown that the temperature profile of the interconnect line has a space-time distribution and thus we propose some new suggestions to floorplanning when considering this effect. The temperature effects on the Power/Ground (P/G) interconnect lines and the Signal interconnect lines are also analyzed. It is shown that the IR drop and the Elmore delay can be increased due to this temperature effect.
Keywords
integrated circuit interconnections; thermal analysis; Elmore delay; IR drop; analytical thermal analysis; on-chip interconnects; power generation mechanism; power/ground interconnect lines; signal interconnect lines; CMOS technology; Energy consumption; Heat transfer; Integrated circuit interconnections; Land surface temperature; Power engineering and energy; Power generation; Temperature distribution; Thermal management; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Communications, Circuits and Systems Proceedings, 2006 International Conference on
Conference_Location
Guilin
Print_ISBN
0-7803-9584-0
Electronic_ISBN
0-7803-9585-9
Type
conf
DOI
10.1109/ICCCAS.2006.285244
Filename
4064491
Link To Document