Title :
n-Rayleigh distribution in mobile computing over flat-fading channel
Author :
Vikas, Gupta ; Deepak, Nagaria
Author_Institution :
Dept. of Electron. & Commun. Eng., Bundelkhand Inst. of Eng. & Technol., Jhansi, India
Abstract :
Characterization of temporal variations in wireless channel impairments plays an important role in the design of a reliable and efficient mobile communication system. Such channels are termed as fading channels since various random phenomena in the propagation path result in fading of the received signal envelope. The exact probability density functions (pdf) and distribution functions (cdf) of a product of independent Rayleigh distributed random variables. The case n = 1 is the classical Rayleigh distribution, while n ?? 2 is the n-Rayleigh distribution that has recently attracted interest in wireless propagation research. The distribution functions are derived by using an inverse Mellin transform technique from statistics, and are given in terms of a special function of mathematical physics. Series forms of the distribution function are also provided for n = 3, 4, 5.
Keywords :
Rayleigh channels; mobile communication; mobile computing; probability; radiowave propagation; random processes; transforms; wireless channels; classical Rayleigh distribution; distribution functions; fading channels; flat-fading channel; independent Rayleigh distributed random variables; inverse Mellin transform technique; mathematical physics; mobile communication system; mobile computing; n-Rayleigh distribution; probability density functions; propagation path; random phenomena; received signal envelope; wireless channel impairments; wireless propagation research; Distributed computing; Distribution functions; Fading; Mobile communication; Mobile computing; Physics; Probability density function; Random variables; Rayleigh channels; Statistical distributions; Fading Channel; Radio Propagation; Rayleigh Distribution;
Conference_Titel :
Methods and Models in Computer Science, 2009. ICM2CS 2009. Proceeding of International Conference on
Conference_Location :
Delhi
Print_ISBN :
978-1-4244-5051-0
DOI :
10.1109/ICM2CS.2009.5397943