DocumentCode :
3275268
Title :
LCP injection molded packages - keys to JEDEC 1 performance
Author :
Ross, Richard J.
Author_Institution :
RJR Polymers, Inc., Oakland, CA, USA
Volume :
2
fYear :
2004
fDate :
1-4 June 2004
Firstpage :
1807
Abstract :
The LCP (liquid crystal polymer) is a class of high performance, high temperature thermoplastic polymers which can be formulated to provide injection molding compounds having properties uniquely advantageous for electronic cavity packages. This paper presents three physical, electrical, and thermal characteristics of the base materials. The packages described include a thermally enhanced LDMOS made of LCP using a three tier assembly system, partially matched RF packages based on the electrical properties of LCP, and leaded packages using a 48 and 52 pin CCD/CMOS configurations as models. While LCP has an outstanding array of properties which make it advantageous for electronic applications, there is a notable disadvantage adhesion. Solutions to this problem can be found in the careful compounding and formulation of the LCP molding material. Formulation of the compounds and process techniques and controls are the keys to LCP package performance. The steps from starting materials to assembled packages are described in this paper.
Keywords :
CMOS integrated circuits; adhesion; charge-coupled devices; injection moulding; integrated circuit packaging; liquid crystal polymers; microassembling; plastic packaging; power MOSFET; semiconductor device packaging; thermal management (packaging); CCD; CMOS; JEDEC 1 performance; LCP injection molded packages; adhesion; assembled packages; electronic cavity packages; high temperature thermoplastic polymer; injection molding compounds; leaded packages; liquid crystal polymer; partially matched RF packages; thermally enhanced LDMOS; three tier assembly system; Assembly systems; Charge coupled devices; Crystalline materials; Electronic packaging thermal management; Electronics packaging; Injection molding; Liquid crystal polymers; Radio frequency; Semiconductor device modeling; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2004. Proceedings. 54th
Print_ISBN :
0-7803-8365-6
Type :
conf
DOI :
10.1109/ECTC.2004.1320364
Filename :
1320364
Link To Document :
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