Title :
Fault detection in EEPLA
Author :
Rajsuman, R. ; Lala, P.K.
Author_Institution :
Dept. of Comput. Eng. & Sci., Case Western Reserve Univ., Cleveland, OH, USA
Abstract :
A testing method for EEPLAs (electrically erasable programmable logic arrays) is presented. The method does not require extra hardware and provides complete fault coverage. In the proposed approach all single and multiple crosspoint faults, stuck-at faults, and bridging faults are detectable. The test set is simple and is easy to derive
Keywords :
logic arrays; logic testing; EEPLA; bridging faults; electrically erasable; fault coverage; multiple crosspoint faults; programmable logic arrays; stuck-at faults; testing method; Electrical fault detection; Fault detection; Fuses; Hardware; Manufacturing; Nonvolatile memory; Programmable logic arrays; Programmable logic devices; Switches; Testing;
Conference_Titel :
Circuits and Systems, 1992. ISCAS '92. Proceedings., 1992 IEEE International Symposium on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0593-0
DOI :
10.1109/ISCAS.1992.230285
