• DocumentCode
    327542
  • Title

    Propagation of variance using a new approximation in system design of integrated circuits

  • Author

    Lei, Junzhao ; Lima-Filho, P. ; Styblinski, M.A. ; Singh, C.

  • Author_Institution
    Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
  • fYear
    1998
  • fDate
    13-17 Jul 1998
  • Firstpage
    242
  • Lastpage
    246
  • Abstract
    In this paper we are concerned with Design For Quality (DFQ), which has recently attracted much attention in system design. Our aim is to introduce effective methods for estimating the variability of a system´s performance. The linear approximation method is perhaps the most often used method for predicting variance propagation in a system. In this paper, we exploit the Moment Method in statistical analysis to extend the linear approximation to quadratic approximation, which will be referred to as Quadratic Propagation of Variance (QPOV). The derivation of the new method is provided and some results of its application in a real circuit are given. Our examples indicate that the new method QPOV gives much more accurate estimates for performance variability. Also this method can be used in other CAD fields
  • Keywords
    MOS integrated circuits; circuit CAD; integrated circuit design; notch filters; statistical analysis; CAD; Design For Quality; MOSFET-C notch filter; Moment Method; Quadratic Propagation of Variance; integrated circuits; linear approximation; performance variability; quadratic approximation; statistical analysis; system design; variance propagation; Circuits; Covariance matrix; Design for quality; Gaussian distribution; Linear approximation; Mathematics; Moment methods; Random variables; Statistical distributions; Taylor series;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace and Electronics Conference, 1998. NAECON 1998. Proceedings of the IEEE 1998 National
  • Conference_Location
    Dayton, OH
  • ISSN
    0547-3578
  • Print_ISBN
    0-7803-4449-9
  • Type

    conf

  • DOI
    10.1109/NAECON.1998.710123
  • Filename
    710123