DocumentCode :
32760
Title :
Analysis of Bohm Diffusions Based on the Ion-Neutral Collisions
Author :
Kwan Chul Lee
Author_Institution :
Nat. Fusion Res. Inst., Daejeon, South Korea
Volume :
43
Issue :
2
fYear :
2015
fDate :
Feb. 2015
Firstpage :
494
Lastpage :
500
Abstract :
Three experimental cases of cross-field diffusions in the magnetized plasmas reported to be related with Bohm diffusion are investigated based on the ion current induced by the ion-neutral collisions. High diffusion coefficient for the original Bohm/Simon experiments and the recent experiments of strongly pulsed plasmas can be explained by the gyro-center shift current combined with the short circuit effect, which is different from the turbulence-induced transport of nuclear fusion devices. It can be deduced that Bohm´s interpretation of diffusion with 1/B dependence came from the fact that the short circuit effect of his experiment was limited by the parallel ion velocity. The ratio of azimuthal current density to the discharge current density measured in the pulsed magnetron experiments is analyzed to be constant and independent from the magnitude of magnetic field due to the maximum condition for the Pedersen conductivity.
Keywords :
Tokamak devices; arcs (electric); plasma collision processes; plasma density; plasma toroidal confinement; plasma transport processes; Bohm diffusion analysis; Pedersen conductivity; arc discharges; crossfield diffusion coefficient; discharge current density; gyrocenter shift current; ion current; ion-neutral collisions; magnetic field magnitude; magnetized plasmas; nuclear fusion devices; parallel ion velocity; pulsed magnetron experiments; short circuit effect; strongly pulsed plasmas; tokamak; turbulence-induced transport; Azimuthal current; Conductivity; Current density; Discharges (electric); Ions; Plasma temperature; Bohm diffusion; ion-neutral collision; plasma confinement; short circuit effect; short circuit effect.;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2014.2363942
Filename :
6949672
Link To Document :
بازگشت