DocumentCode :
3276223
Title :
Parallel simulated annealing strategies for VLSI cell placement
Author :
Chandy, John A. ; Banerjee, Prithviraj
Author_Institution :
Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA
fYear :
1996
fDate :
3-6 Jan 1996
Firstpage :
37
Lastpage :
42
Abstract :
Simulated annealing based standard cell placement for VLSI designs has long been acknowledged as a compute-intensive process, and as a result several research efforts have been undertaken to parallelize this algorithm. Most previous parallel approaches to cell placement annealing have used a parallel moves approach. In this paper we investigate two new approaches that have been proposed for generalized parallel simulated annealing but have not been applied to the cell placement problem. Results are presented on the effectiveness of implementations of these algorithms when applied to the cell placement problem. We find that the first, multiple Markov chains, appears to be promising since it uses parallelism to obtain near linear speedups with no loss in quality. The second, speculative computation, while maintaining quality is not suitable since no speedups are achieved due to the specific nature of the cell placement problem. The two algorithms are compared with the parallel moves approach to parallel cell placement
Keywords :
Markov processes; VLSI; circuit layout CAD; integrated circuit layout; parallel algorithms; simulated annealing; VLSI cell placement; VLSI design; cell placement annealing; multiple Markov chains; parallel moves approach; parallel simulated annealing strategies; speculative computation; standard cell placement; Algorithm design and analysis; Circuit synthesis; Circuit testing; Computational modeling; Concurrent computing; Design automation; Object oriented modeling; Simulated annealing; Very large scale integration; Yarn;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 1996. Proceedings., Ninth International Conference on
Conference_Location :
Bangalore
ISSN :
1063-9667
Print_ISBN :
0-8186-7228-5
Type :
conf
DOI :
10.1109/ICVD.1996.489451
Filename :
489451
Link To Document :
بازگشت