Title :
Study on Key technology of BIT and self diagnosis of complex weapon equip
Author :
Rui, Ma Cen ; Zheng, Long Guang
Author_Institution :
Missile Inst., Air Force Eng. Univ., Xian, China
Abstract :
It is an important approach that BIT(built-in test)can be used to improve the diagnosis ability of weapon system along with the weapon equip complexity increasing. And it is put forward that self diagnosis technology based on BIT is significant by analyzing the internal property of BIT and combining the correlative studies. Then detailedly analyzes the principle of self diagnosis system based on BIT and the approach of technology study. And its key technology is discussed on how to construct a self diagnosis system based on BIT. Finally it is viewed that the foreground of the application of self diagnosis system based on BIT.
Keywords :
built-in self test; military equipment; weapons; BIT; built-in test; complex weapon equip complexity; self diagnosis ability; self diagnosis technology; weapon system; Artificial intelligence; Circuit faults; Computers; Fault diagnosis; Missiles; Testing; BIT; complex Equip; self-Diagnosis;
Conference_Titel :
Electric Information and Control Engineering (ICEICE), 2011 International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-8036-4
DOI :
10.1109/ICEICE.2011.5777409