DocumentCode :
3276275
Title :
Sub-threshold charge recovery circuits
Author :
Khatir, Mehrdad ; Mohammadi, Hassan Ghasemzadeh ; Ejlali, Alireza
Author_Institution :
Dept. of Comput. Eng., Sharif Univ. of Technol., Tehran, Iran
fYear :
2010
fDate :
3-6 Oct. 2010
Firstpage :
138
Lastpage :
144
Abstract :
Embedded systems account for wide range of applications. However, the design of such systems is faced with a diverse spectrum of criteria. The energy consumption, performance, and demanding security concerns are some of the most significant challenges in designing of such systems. With these challenges, the design process can be managed more easily if a flexible logic circuit with the ability of satisfying the above-mentioned concerns is taken into account. To achieve such a logic circuit, in this paper we have combined the sub-threshold operation and charge recovery techniques. Using our technique, lower power consumption, ability of operating at higher frequencies, and more security (to side channel attacks) than the existing logic circuits are achieved. This paper also presents an analytical proof about how sub-threshold charge recovery circuits can meet these characterizations. we have also confirmed our analytical discussions by examining our technique for full adder, and 8×8 carry-save multiplier in different frequencies, supply voltages, and CMOS technologies. Detailed SPICE simulations show significant improvements as compared to its existing counterparts in all simulated frequencies and supply voltages.
Keywords :
SPICE; embedded systems; energy consumption; flexible electronics; logic circuits; SPICE simulations; embedded systems; energy consumption; flexible logic circuit; security; sub-threshold charge recovery circuits; Adders; CMOS integrated circuits; Energy consumption; Integrated circuit modeling; Inverters; Power demand; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Design (ICCD), 2010 IEEE International Conference on
Conference_Location :
Amsterdam
ISSN :
1063-6404
Print_ISBN :
978-1-4244-8936-7
Type :
conf
DOI :
10.1109/ICCD.2010.5647815
Filename :
5647815
Link To Document :
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