Title :
Ultra-sensitive hot-electron nanobolometers for THz astrophysics
Author :
Karasik, Boris S. ; Pereverzev, Sergey V. ; Wei, Jian ; Olaya, David ; Gershenson, Michael E. ; Sergeev, Andrei V. ; Cantor, Robin
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA
Abstract :
The background-limited spectral imaging of the early Universe requires terahertz (THz) detectors with the sensitivity 2-3 orders of magnitude better than that of the state-of-the-art bolometers. To realize this sensitivity without sacrificing the operating speed, the sensing element of a bolometric detector should have an exceptionally high thermal isolation from the environment combined with an ultrasmall heat capacity. We have demonstrated that this goal can be achieved by realizing a superconducting hot-electron nanobolometer whose design blocks photon and phonon energy exchange through its contact leads. The remaining coupling due to electron-phonon interaction provides thermal control at a level of one thousandth of the quantum of thermal conductance GQ ap 1 [pW/K] times T. These hot-electron nanobolometers with a heat capacity of ~ 0.1 aJ/K will be sufficiently sensitive for registration of single THz photons. These devices are very promising for submillimeter astronomy and other applications based on quantum calorimetry and photon counting.
Keywords :
bolometers; electron-positron interactions; nanosensors; specific heat; terahertz wave detectors; background-limited spectral imaging; electron-phonon interaction; heat capacity; superconducting hot-electron nanobolometer; thermal conductance; thermal isolation; ultra-sensitive hot-electron nanobolometers; Astrophysics; Bolometers; Charge carrier processes; Detectors; Energy exchange; Optical control; Optical imaging; Phonons; Temperature control; Thermal conductivity;
Conference_Titel :
Infrared, Millimeter and Terahertz Waves, 2008. IRMMW-THz 2008. 33rd International Conference on
Conference_Location :
Pasadena, CA
Print_ISBN :
978-1-4244-2119-0
Electronic_ISBN :
978-1-4244-2120-6
DOI :
10.1109/ICIMW.2008.4665618