Title :
Random-coding-exponent-based design of coded modulation for multiple-symbol differential detection
Author :
Lampe, Lutz H J ; Fischer, Robert F H
Author_Institution :
Lehrstuhl fur Nachrichtentech., Erlangen-Nurnberg Univ., Germany
Abstract :
Coded modulation (CM) matched to M-ary differential phase-shift keying (MDPSK) modulation over Rayleigh block fading channels with multiple-symbol differential detection (MSDD) is discussed. Different coding techniques are assessed by evaluating the associated random coding exponent (RCE), i.e., taking the decoding delay into account. Let the channel coherence time be N samples. At the transmitter, N-1 uniform i.i.d. (differential) PSK data symbols (phase increments, i.e., prior to differential encoding) are combined into a vector a. At the receiver, a vector y comprises the N corresponding received signal samples. Between a and y a vector channel is established, which is assumed to be memoryless, even when imposing delay constraints. Channel coding and decoding is done with respect to vectors a and y, respectively, containing l=(N-1)log2(M) coded binary digits
Keywords :
Rayleigh channels; channel coding; decoding; delays; differential detection; differential phase shift keying; memoryless systems; modulation coding; random codes; M-ary differential phase-shift keying; MDPSK; Rayleigh block fading channels; bit-interleaved coded modulation; channel coding; channel coherence time; coded binary digits; coded modulation; decoding; decoding delay; delay constraints; differential encoding; memoryless channel; multilevel coding; multiple-symbol differential detection; multistage decoding; phase increments; random coding exponent; random-coding-exponent-based design; received signal samples; transmitter; uniform i.i.d. PSK data symbols; vector channel; Channel coding; Decoding; Delay; Differential phase shift keying; Fading; Modulation coding; Phase detection; Phase modulation; Phase shift keying; Transmitters;
Conference_Titel :
Information Theory, 2001. Proceedings. 2001 IEEE International Symposium on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-7123-2
DOI :
10.1109/ISIT.2001.936026