Title :
Material scanner in the lower THz
Author :
Krebs, C. ; Schneider, S. ; Nussler, D.
Author_Institution :
RheinAhrCampus, Remagen
Abstract :
The aim of the project is the development of an imaging system for material characterizations. Measurements with real aperture have been conducted at the frequency range between 75 GHz - 220 GHz in amplitude and phase and from 75 GHz - 260 GHz in amplitude. To increase the measurement time a synthetic aperture (SAR) method will be tested. The following paper presents the actually project results.
Keywords :
millimetre wave detectors; optical scanners; synthetic aperture radar; frequency 75 GHz to 260 GHz; lower THz range; material scanner; real aperture; synthetic aperture method; Antenna measurements; Dielectric measurements; Frequency measurement; Image reconstruction; Impurities; Optical waveguides; Phase measurement; Pollution measurement; Testing; Wavelength measurement;
Conference_Titel :
Infrared, Millimeter and Terahertz Waves, 2008. IRMMW-THz 2008. 33rd International Conference on
Conference_Location :
Pasadena, CA
Print_ISBN :
978-1-4244-2119-0
Electronic_ISBN :
978-1-4244-2120-6
DOI :
10.1109/ICIMW.2008.4665624
