DocumentCode :
3276567
Title :
Optimal dirac approximation by exploiting independencies
Author :
Eberhardt, H. ; Klumpp, V. ; Hanebeck, U.D.
Author_Institution :
Intell. Sensor-Actuator-Syst. Lab. (ISAS), Karlsruhe Inst. of Technol., Karlsruhe, Germany
fYear :
2010
fDate :
June 30 2010-July 2 2010
Firstpage :
1392
Lastpage :
1398
Abstract :
The sample-based recursive prediction of discrete-time nonlinear stochastic dynamic systems requires a regular reapproximation of the Dirac mixture densities characterizing the state estimate with an exponentially increasing number of components. For that purpose, a systematic approximation method is proposed that is deterministic and guaranteed to minimize a new type distance measure, the so called modified Cramér-von Mises distance. A huge increase in approximation performance is achieved by exploiting structural independencies usually occurring between the random variables used as input to the system. The corresponding prediction step achieves optimal performance when no further assumptions can be made about the system function. In addition, the proposed approach shows a much better convergence compared to the prediction step of the particle filter and by far fewer Dirac components are required for achieving a given approximation quality. As a result, the new approximation method opens the way for the development of new fully deterministic and optimal stochastic state estimators for nonlinear dynamic systems.
Keywords :
Dirac equation; approximation theory; discrete time systems; nonlinear systems; optimal systems; recursive estimation; state estimation; stochastic systems; Cramer-von Mises distance; Dirac mixture density; discrete time nonlinear stochastic dynamic system; optimal Dirac approximation; optimal stochastic state estimator; sample-based recursive prediction; systematic approximation; Approximation methods; Bayesian methods; Convergence; Density measurement; Nonlinear control systems; Optimal control; Particle filters; Random variables; State estimation; Stochastic systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
American Control Conference (ACC), 2010
Conference_Location :
Baltimore, MD
ISSN :
0743-1619
Print_ISBN :
978-1-4244-7426-4
Type :
conf
DOI :
10.1109/ACC.2010.5530503
Filename :
5530503
Link To Document :
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