Title :
On more efficient combinational ATPG using functional learning
Author :
Mukherjee, Rajarshi ; Jain, Jawahar ; Fujita, Mariahiro ; Abraham, Jacob A. ; Fussell, Donald S.
Author_Institution :
Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA
Abstract :
Learning techniques like SOCRATES and recursive learning have greatly enhanced the technology of FAN-based ATPG. In this paper we present a test generation methodology for combinational circuits using functional learning, discuss application of novel functional information to enhance ATPG and present ATPG results on ISCAS 85 benchmark circuits. The test generation methodology combines the use of structural (topology) based analysis methods with the function representation techniques (such as BDDs)
Keywords :
automatic testing; combinational circuits; integrated circuit testing; logic testing; BDD; FAN-based ATPG; SOCRATES; combinational ATPG; function representation techniques; functional learning; logic testing; recursive learning; structural based analysis methods; test generation methodology; topology; Automatic test pattern generation; Benchmark testing; Boolean functions; Circuit testing; Combinational circuits; Data structures; Jacobian matrices; Signal analysis; Signal processing; Wire;
Conference_Titel :
VLSI Design, 1996. Proceedings., Ninth International Conference on
Conference_Location :
Bangalore
Print_ISBN :
0-8186-7228-5
DOI :
10.1109/ICVD.1996.489467
