DocumentCode :
3276700
Title :
Sequential circuits with combinational test generation complexity
Author :
Balakrishnan, Arun ; Chakradhar, Srimat T.
Author_Institution :
RUTCOR, Rutgers Univ., Piscataway, NJ, USA
fYear :
1996
fDate :
3-6 Jan 1996
Firstpage :
111
Lastpage :
117
Abstract :
We propose a new design for testability (DFT) technique which, like full scan design, guarantees that tests can be derived using a combinational test generator. Our DFT technique has two important advantages over full scan design: (1) the area overhead incurred by our technique is significantly less and (2) the test application time for our technique is significantly lower. This DFT technique selects scan flip-flops and/or test points such that, in the test mode, the circuit will belong to a special class of sequential circuits that we call strongly balanced structures. We give a simple characterization for strongly balanced structures and provide efficient methods to select scan flip-flops and/or test points to reduce any sequential circuit to a strongly balanced structure. A complete test set can be obtained for a strongly balanced structure using a combinational test generator. Experimental results on ISCAS 89 benchmark circuits and production VLSI circuits show that both the DFT overhead and the test application time are substantially lower for our technique
Keywords :
VLSI; automatic test software; design for testability; integrated circuit testing; integrated logic circuits; logic design; logic testing; sequential circuits; DFT technique; VLSI circuits; area overhead reduction; combinational test generation complexity; design for testability; scan flip-flops; sequential circuits; strongly balanced structures; test application time reduction; Benchmark testing; Circuit testing; Design for testability; Flip-flops; National electric code; Production; Sequential analysis; Sequential circuits; Shift registers; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 1996. Proceedings., Ninth International Conference on
Conference_Location :
Bangalore
ISSN :
1063-9667
Print_ISBN :
0-8186-7228-5
Type :
conf
DOI :
10.1109/ICVD.1996.489468
Filename :
489468
Link To Document :
بازگشت