Title :
Experimental evaluation of two criteria for pattern comparison and alignment
Author :
Shekhar, C. ; Chellappa, R.
Author_Institution :
Center for Autom. Res., Maryland Univ., College Park, MD, USA
Abstract :
Pattern comparison and pattern alignment are related tasks. The former requires the use of a similarity measure for discriminating between patterns of different classes, while the latter requires a measure of the degree of alignment of two similar patterns. This paper presents an experimental evaluation of two promising measures, Fourier phase correlation and mutual information, which can be used for quantifying the similarity as well as the degree of alignment of two patterns. It is shown that these measures are quite stable to a range of pattern intensity variations, while exhibiting gradual monotonic decrease in the presence of geometric transformations. Phase correlation is more resistant to pattern noise and interference, whereas mutual information is more resistant to intensity variations and geometric distortions
Keywords :
Fourier analysis; correlation methods; pattern recognition; Fourier phase correlation; geometric distortions; geometric transformations; interference; mutual information; pattern alignment; pattern comparison; pattern intensity variations; pattern noise; similarity measure; Acoustic noise; Automation; Distortion measurement; Educational institutions; Interference; Mutual information; Phase distortion; Phase measurement; Phase noise; Sensor fusion;
Conference_Titel :
Pattern Recognition, 1998. Proceedings. Fourteenth International Conference on
Conference_Location :
Brisbane, Qld.
Print_ISBN :
0-8186-8512-3
DOI :
10.1109/ICPR.1998.711101